Article “Process variation (semiconductor)” in English Wikipedia has 24.5 points for quality (as of July 1, 2025). The article contains 4 references and 11 sections.
Since the creation of article “Process variation (semiconductor)”, its content was written by 12 registered users of English Wikipedia and edited by 12 registered Wikipedia users in all languages.
The article is cited 10 times in English Wikipedia and cited 10 times in all languages.
The highest Authors Interest rank from 2001:
The highest popularity rank from 2008:
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from July 1, 2025 (including revision history and pageviews for previous years).
| Best Rank | English: #852446 10.2013 |
Global: #1525704 04.2018 |
| Best Rank | English: #315472 08.2012 |
Global: #734458 08.2012 |
On 21 February 2026 in multilingual Wikipedia, Internet users most often read articles on the following topics: Jeffrey Epstein, Alysa Liu, Eric Dane, 2026 Winter Olympics, Rebecca Gayheart, Johannes Høsflot Klæbo, Wuthering Heights, amyotrophic lateral sclerosis, Andrew Mountbatten-Windsor, John F. Kennedy Jr..
In English Wikipedia the most popular articles on that day were: Eric Dane, Alysa Liu, Rebecca Gayheart, Jeffrey Epstein, 2026 Winter Olympics, Eileen Gu, John F. Kennedy Jr., Carolyn Bessette Kennedy, Deaths in 2026, Johannes Høsflot Klæbo.
The WikiRank project is intended for automatic relative evaluation of the articles in the various language versions of Wikipedia. At the moment the service allows to compare over 44 million Wikipedia articles in 55 languages. Quality scores of articles are based on Wikipedia dumps from July, 2025. When calculating current popularity and AI of articles data from June 2025 was taken into account. For historical values of popularity and AI WikiRank used data from 2001 to 2025... More information
$$Quality=1/c∑↙{i=1}↖c nm_i-RS=1/5(11.42+3.25+0+78.57+29.27)$$
where:
The results of the calculations may be slightly different because of rounded values of normalized metrics in formulas
